標(biāo)準(zhǔn)號：BS EN 60749-24-2004
中文標(biāo)準(zhǔn)名稱：半導(dǎo)體器件.機(jī)械和氣候試驗(yàn)方法.加速耐濕性.無偏差HAST
英文標(biāo)準(zhǔn)名稱：Semiconductor devices - Mechanical and climatic test methods - Accelerated moisture resistance - Unbiased HAST
標(biāo)準(zhǔn)類型：L40
發(fā)布日期：2004/6/24 12:00:00
實(shí)施日期：2004/6/24 12:00:00
中國標(biāo)準(zhǔn)分類號：L40
國際標(biāo)準(zhǔn)分類號：31.080.01
適用范圍：The unbiased highly accelerated stress testing (HAST) is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments. It is a highly accelerated test which employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material (encapsulant or seal) or along the interface between the external protective material and the metallic conductors which pass through it. Bias is not applied in this test to ensure that the failure mechanisms potentially overshadowed by bias can be uncovered (e.g. galvanic corrosion). This test is used to identify failure mechanisms internal to the package and is destructive. NOTE This test is a complete rewrite of the test contained in Clause 4C of Chapter 3 of IEC 60749 (1996) (without bias voltage).