標(biāo)準(zhǔn)號：ASTM E668-2000
中文標(biāo)準(zhǔn)名稱：運(yùn)用熱發(fā)光放射量測定系統(tǒng)(TLD)在電子設(shè)備放射危害性試驗(yàn)中測定吸收劑量的標(biāo)準(zhǔn)實(shí)施規(guī)范
英文標(biāo)準(zhǔn)名稱：Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
發(fā)布日期：1999/12/31 12:00:00
實(shí)施日期：1999/12/31 12:00:00
國際標(biāo)準(zhǔn)分類號：31.020 (Electronic components in general)
適用范圍： Note 1-The purpose of the upper and lower limits on the energy for electron irradiation is to approach a limiting case where dosimetry is simplified. Specifically, the dosimetry methodology specified requires that the following three limiting conditions be approached: (a) energy loss of the primary electrons is small, (b) secondary electrons are largely stopped within the dosimeter, and (c) bremsstrahlung radiation generated by the primary electrons is largely lost.