標準號：ISO 8289-2000
中文標準名稱：釉瓷和搪瓷 檢查和定位缺陷的低電壓試驗
英文標準名稱：Vitreous and porcelain enamels - Low voltage test for detecting and locating defects
標準類型：Y20
發(fā)布日期：1999/12/31 12:00:00
實施日期：1999/12/31 12:00:00
中國標準分類號：Y20
國際標準分類號：25.220.50
適用范圍：This International Standard specifies two low voltage tests for detecting and locating defects that extend to the basis metal in vitreous and porcelain enamel coatings. Method A (electrical) is suitable for the rapid detection and determination of the general location of defects. Method B (optical), based on colour effects, is suitable for the more precise detection of defects and their exact locations. Method A is commonly applied to flat surfaces, whereas method B is preferred for more intricate shapes. NOTE 1 Selection of the correct test method is critical to distinguish the areas of increased conductivity detected by method B from actual pores that extend to the basis metal, which can be detected by both methods. NOTE 2 The low voltage test is a non-destructive method of detecting defects (see clause 3) and therefore, is completely differ-ent from the high voltage test specified in ISO 2746. The results of high and low voltage tests are not comparable and will differ.