標(biāo)準(zhǔn)號(hào)：BS EN 12544-2-2000
中文標(biāo)準(zhǔn)名稱：無損檢驗(yàn).X射線管電壓的測(cè)量和評(píng)估.用厚濾膜法進(jìn)行連續(xù)檢驗(yàn)
英文標(biāo)準(zhǔn)名稱：Non-destructive testing - Measurement and evaluation of the X-ray tube voltage - Constancy check by the thick filter method
標(biāo)準(zhǔn)類型：H26
發(fā)布日期：2000/6/15 12:00:00
實(shí)施日期：2000/6/15 12:00:00
中國(guó)標(biāo)準(zhǔn)分類號(hào)：H26
國(guó)際標(biāo)準(zhǔn)分類號(hào)：19.100
適用范圍：This standard specifies a constancy check of a X-ray system where mainly the X-ray voltage is checked and also the tube current and the constitution of the target which can be changing due to ageing of the tube. The thick filter method is based on a measurement of the dose rate behind a defined thick filter using defined distances between the X-ray tube, the filter and the measuring device. This method is very sensitive to changes of the voltage, but it does not provide an absolute value for X-ray tube voltage. Therefore, a reference value is needed and, it is recommended to find this reference, for example, within the acceptance test of the system. The thick filter method is a rather simple technique and may be applied by the operator of an X-ray system to performregularly a constancy check of the system. The method can also be applied for consistency checks after changing components which may affect the X-ray tube voltage. This method can be applied for all types of X-ray systems, i.e. for constant potential, half wave and impulse wave generators with a tube current larger than 1 mA.