標(biāo)準(zhǔn)號：ISO 12179-2000
中文標(biāo)準(zhǔn)名稱：產(chǎn)品幾何量技術(shù)規(guī)范(GPS) 表面結(jié)構(gòu):輪廓法 接觸(觸針)式儀器的校準(zhǔn)
英文標(biāo)準(zhǔn)名稱：Geometrical Product Specifications (GPS) - Surface texture: Profile method - Calibration of contact (stylus) instruments
標(biāo)準(zhǔn)類型：J04
發(fā)布日期：1999/12/31 12:00:00
實施日期：1999/12/31 12:00:00
中國標(biāo)準(zhǔn)分類號：J04
國際標(biāo)準(zhǔn)分類號：17.040.30
適用范圍：This International Standard applies to the calibration of the metrological characteristics of contact (stylus) instruments for the measurement of surface texture by the profile method as defined in ISO 3274. The calibration is to be carried out with the aid of measurement standards. Annex B applies to the calibration of metrological characteristics of simplified operator contact (stylus) instruments which do not conform with ISO 3274.