標準號：BS ISO 15202-3-2004
中文標準名稱：工作場所空氣.電感耦合等離子體原子發射光譜法測定氣載顆粒物質中的金屬和類金屬物.分析
英文標準名稱：Workplace air - Determination of metals and metalloids in airborne particulate matter by inductively coupled plasma atomic emission spectrometry - Analysis
標準類型：Z15
發布日期：2004/12/8 12:00:00
實施日期：2004/12/8 12:00:00
中國標準分類號：Z15
國際標準分類號：13.040.30
適用范圍：This part of ISO 15202 specifies a procedure for the use of inductively coupled plasma atomic emission spectrometry for analysing test solutions prepared as prescribed in ISO 15202-2 from samples of airborne particulate matter collected as specified in ISO 15202-1. Method development, performance checks and a routine analysis method are specified. This part of ISO 15202 is applicable for the assessment of workplace exposure to metals and metalloids for comparison with limit values (see e.g. EN 689[1], ASTM E 1370[2], etc.). The following is a non-exclusive list of metals and metalloids for which limit values have been set (see Reference [3]), and for which one or more of the sample dissolution methods specified in ISO 15202-2 and the analytical procedure described in this part of ISO 15202 are applicable. However, there is no information available on the effectiveness of any of the sample dissolution methods specified in ISO 15202-2 for those elements in italics. aluminium calcium magnesium selenium tungsten antimony chromium manganese silver uranium arsenic cobalt mercury sodium vanadium barium copper molybdenum strontium yttrium beryllium hafnium nickel tantalum zinc bismuth indium phosphorus tellurium zirconium boron iron platinum thallium caesium lead potassium tin cadmium lithium rhodium titanium NOTE ISO 15202 is not applicable to determination of elemental mercury, since mercury vapour is not collected using the sampling method specified in ISO 15202-1. The procedure is suitable for assessment of exposure against the long-term exposure limits for most of the metals and metalloids listed above when sampling at a typical flow rate of 2 lmin for sampling times in the range 30 min to 8 h and for assessment of exposure against the short-term exposure limits, where applicable (see 10.4). The procedure suffers from no significant spectral interferences (see 10.5), provided that suitable analytical wavelengths are used. However, inaccurate background correction and/or inadequate matrix-matching can adversely affect results.