標準號：BS EN 160200-2-1998
中文標準名稱：電子元器件質量評定協調體系.分規范:經質量評定的微波模數電子器件.試驗方法索引
英文標準名稱：Harmonized system of quality assessment for electronic components - Sectional specification - Microwave modular electronic units of assessed quality - Index of test methods
標準類型：L10
發布日期：1998/3/15 12:00:00
實施日期：1998/3/15 12:00:00
中國標準分類號：L10
國際標準分類號：31.190
適用范圍：This Part 2 of the Sectional Specification EN 160200 defines standard/reference test methods for Electrical, Mechanical and Visual Inspection as prescribed in Part 1 of the Sectional Specification EN 160200 and Blank Detail Specification EN 160201 for Microwave Modular Electronic Units (MMEUs). Section three of EN 160200-1 details general requirements for test and measurement procedures (including environmental test requirements). This Standard specifies a wide range of documents which relate to microwave test methods. Many of which are not covered by IEC or CECC specifications. Although a number of test methods are under preparation by IEC and CECC they are considered acceptable for use in this Standard. Where test methods have been considered suitable for insertion into this Standard they are either referenced under clause 2.4 - Standard Test Methods or detailed in full under clause 2.5 - Special Test Methods. Examples of MMEUs which are covered by these test methods are: - Amplifiers - Attenuators - Couplers/Power dividers - Filters - Isolators/Circulators - Limiters - Mixers - Noise Sources - Oscillators - Phase Shifters - Switches - Transmitters (e.g. Integrated Multichannel) Guidance on the prime electrical characteristics to be measured is given in annex C of the Blank Detail Specification (BDS) - EN 160201. This Part 2 of EN 160200 will be reviewed as other test methods become available.