標準號：IEC 62132-3-2007
中文標準名稱：集成電路.150kHz～1GHz電磁抗擾性的測量.第3部分:大容量電流注入(BCI)法
英文標準名稱：Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 3: Bulk current injection (BCI) method
標準類型：L56
發布日期：1999/12/31 12:00:00
實施日期：1999/12/31 12:00:00
中國標準分類號：L56
國際標準分類號：31.200
引用標準：IEC 62132-1-2006
適用范圍：This part of IEC 621 32 describes a bulk current injection(BCI)test method to measure the immunity of integrated circuts(IC) in the presence of conducted RF disturbances，e．g．resulting from radiated RF disturbances．This method only applies to ICs that have off-board Wire connections e. g．into a cable harness．This test method is used to inject RF current on one or a combjnation of wires．This standard establishes a common base for the evaluation of semiconductor devices to be applied in equipment used in environments that are subject to unwanted radio frequency electromagnetic signals．