標準號：IEC 62433-2-2008
中文標準名稱：EMC IC建模.第2部分:EMI動作模擬用集成電路模型.傳導發射建模(ICEM-CE)
英文標準名稱：EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted Emissions modelling (ICEM-CE)
標準類型：L55
發布日期：1999/12/31 12:00:00
實施日期：1999/12/31 12:00:00
中國標準分類號：L55
國際標準分類號：31.200;33.100.20
引用標準：IEC 61967;IEC 61967-4
適用范圍：This part of IEC 62433 specifies macro-models for ICs to simulate conducted electromagneticemissions on a printed circuit board. The model is commonly called Integrated CircuitEmission Model - Conducted Emission (ICEM-CE).The ICEM-CE model can also be used for modelling an IC-die, a functional block and anIntellectual Property block (IP).The ICEM-CE model can be used to model both digital and analogue ICs.Basically, conducted emissions have two origins:~ conducted emissions through power supply terminals and ground reference structures;~ conducted emissions through input/output (1/O) terminals.The ICEM-CE model addresses those two types of origins in a single approach.This standard defines structures and components of the macro-model for EMI simulationtaking into account the IC's internal activities.This standard gives general data, which can be implemented in different formats or languagessuch as IBIS, IMIC, SPICE, VHDL-AMS and Verilog. SPICE is however chosen as defaultsimulation environment to cover all the conducted emissions.This standard also specifies requirements for information that shall be incorporated in eachICEM-CE model or component part of the model for model circulation, but description syntaxis not within the scope of this standard.