標準號：IEC 60749-11-2002
中文標準名稱：半導體器件.機械和氣候試驗方法.第11部分: 溫度的急速變化.雙液電鍍槽法
英文標準名稱：Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature; Two-fluid-bath method
標準類型：L40
發布日期：1999/12/31 12:00:00
實施日期：1999/12/31 12:00:00
中國標準分類號：L40
國際標準分類號：31.080.01
適用范圍：This part of IEC 60749 defines the rapid change of temperature test method and the two-fluid-bath method. When both test methods are performed as part of a device qualification, results of air to air temperature cycling take priority over this two-fluid-bath test method. This test method may also be used, employing fewer cycles (e.g. 5 to 10 cycles), to test the effect of immersion in heated liquids that are used for the purpose of cleaning devices. This test is applicable to all semiconductor devices. It is considered destructive unless otherwise detailed in the relevant specification. In general, this rapid change of temperature and two-fluid bath method test is in conformity with IEC 60068-2-14 but, due to specific requirements of semiconductors, the clauses of this standard apply.