標準號：IEC 60749-13-2002
中文標準名稱：半導體器件.機械和氣候試驗方法.第13部分: 鹽性環(huán)境
英文標準名稱：Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
標準類型：L40
發(fā)布日期：1999/12/31 12:00:00
實施日期：1999/12/31 12:00:00
中國標準分類號：L40
國際標準分類號：31.080.01
適用范圍：This part of IEC 60749 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive In general, this salt atmosphere test is in conformity with IEC 60068-2-11 but, due to specific requirements of semiconductors, the clauses of this standard apply.