標(biāo)準(zhǔn)號：BS EN 60749-23-2004+A1-2011
中文標(biāo)準(zhǔn)名稱：半導(dǎo)體器件.機械和氣候試驗方法.高溫使用壽命
英文標(biāo)準(zhǔn)名稱：Semiconductor devices. Mechanical and climatic test methods. High temperature operating life
標(biāo)準(zhǔn)類型：L40
發(fā)布日期：2004/6/24 12:00:00
實施日期：2004/6/24 12:00:00
中國標(biāo)準(zhǔn)分類號：L40
國際標(biāo)準(zhǔn)分類號：31.080.01
引用標(biāo)準(zhǔn)：IEC 60747;IEC 60749-34
適用范圍：This test is used to determine the effects of bias conditions and temperature on solid statedevices over time. It simulates the device operating condition in an accelerated way, and isprimarily used for device qualification and reliability monitoring. A form of high temperaturebias life using a short duration, popularly known as “burn-in”, may be used to screen for infantmortality related failures. The detailed use and application of burn-in is outside the scope ofthis standard.